Dimple Grinder TEM-DG-200 is a mechanical thinning instrument, designed for the reproducible preparation of high quality electron microscopy specimen, greatly reducing ion milling time, uneven thinning and surface defects.
The TEM-DG-200 Dimple Grinder reduces central region of a typical 100 micron thick specimen down to 15 micron with minimal damage to the specimen while preserving strong thick specimen rim. Specimen stub can mount 3mm diameter specimen with high precision using the special engraved ring. This can be achieved by using low melting point specimen mounting wax and Mascotek Hot Plate TEM-HP-150. Machine has facility to vary the grinding / polishing wheel speed up to 200 rpm while ensuring minimal vibration during grinding.
Positioning of the specimen can be observed by using 45X optical microscope.
Both grinding and polishing operations ensure specimen readiness for subsequent twin jet electropolishing or ion beam milling to achieve sufficiently large area electron transparency for TEM imaging. The machine is capable of monitoring the dimple grinding process and displays actual grinding thickness and terminates the process once the desired thickness of specimen is reached.
The Dimple Grinder is equipped with an analog dial indicator which gives a continuous display of the dimpling depth. The system enables accurate dimpling to be performed with prior knowledge of the specimen thickness.
The dimple grinder can incorporate different types of wheels:
A 45X microscope attachment allows direct observation with illumination without the need to remove the specimen
230VAC, 50 Hz
L 350mm X W 360mm x H 225mm

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