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DIMPLER GRINDER TEM-DG-200

A mechanical thinning instrument, designed for the reproducible preparation of high- quality electron microscopy specimen, greatly reducing ion milling times, uneven thinning, surface defects & irradiation damage

Features

  • Reduces the central region of a typical 100 µm thick, 3 mm diameter specimen blank to a few microns with minimal damage
  • The grinder polishes the specimen to near electron transparency
  • Grinding wheels for rapid material removal without scratching
  • Polishing felt wheels for an optimal surface finish
  • Wheels with different diameters for various dimple profiles
  • Monitors and displays the dimpling parameters to enable termination once the set time for specimen thinning is reached

Microscope:

A 45X microscope attachment allows direct observation with illumination without the need to remove the specimen

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Accessories

Specimen Hot Plate

  • It is most important that specimen is firmly attached during dimpling. This is best done by using a low melting point wax to form a strong, thin, hard adhesive bond
  • The Specimen Mounting Hot Plate is thermostatically controlled at the precise mounting temperature of 135°C
  • The set point of the hot plate can be programmed from room temperature to 150°C
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    Mascotek Scientific Private Limited

    Is Involved in indigenous design, development and manufacturing of Electron Microscopy related specimen preparation
    equipment for subsequent analysis

    Vision

    Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) analysis.

    Mission

    Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) analysis.

    Quaity Assurance

    Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) analysis.

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